Title :
An automated system for testing readout electronics of silicon strip x-ray detectors
Author :
Maj, Piotr ; Goral, Adrian ; Grybos, Pawel
fDate :
Oct. 27 2012-Nov. 3 2012
Abstract :
We present the DEDIXtest system, which is a tool for testing DEDIX chip - a 64-channel application specific integrated circuit (ASIC) designed for readout of silicon strip detectors used in X-ray imaging applications. For communication with ASIC we use the commercially available interface board featuring a real-time processor and a set of digital inputs and outputs controlled by a field programmable gate array. This application features a user interface module, which allows convenient definition of tasks for the program and clear presentation of measurement results. For validation of the developed software we performed a set of simple tests for each of the implemented procedures, using X-ray tubes applied in diffractometers.
Keywords :
X-ray imaging; application specific integrated circuits; readout electronics; semiconductor counters; ASIC; DEDIX chip; DEDIXtest system; X-ray imaging; application specific integrated circuit; automated system; field programmable gate array; readout electronics testing; real time processor; silicon strip X-ray detectors; ASICs testing; X-ray imaging; silicon strip detectors; testing software;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4673-2028-3
DOI :
10.1109/NSSMIC.2012.6551269