DocumentCode
2548576
Title
Study of VUV detector based on thinner THGEM for CDEX
Author
Xie Wenqing ; Li Yulan ; Li Jin ; Li Yuanjing ; Yue Qian
Author_Institution
Dept. of Eng. Phys., Tsinghua Univ., Beijing, China
fYear
2012
fDate
Oct. 27 2012-Nov. 3 2012
Firstpage
1127
Lastpage
1130
Abstract
In the China Dark matter EXperiments (CD EX), HPGe is the main target detector while liquid Ar is used to provide the low temperature working environment for HPGe detector. In the meantime, as a scintillation detector, it is also served as a veto detector. Gaseous avalanche Photomultipliers (GPMT) is one of the most promising candidates for the readout of scintillation light from liquid Ar, that is, 128nm Vacuum Ultraviolet light (VUV). Compared with PMT, the GPMT has many advantages, such as lower radioactivity. A kind of GPMT is researched in this study based on THGEM coated with CsI. The influence of different parameters on the THGEM is studied and finally an optimized thinner THGEM (thickness 0.2mm) is selected. CsI is deposited successfully on the top layer of the thinner THGEM by vacuum evaporation. The electric field near the photocathode and gas flowing through the chamber are investigated to get the best working conditions. Simulations and experiment verification are performed and the first detection of VUV using thinner THGEM is carried out successfully.
Keywords
argon; avalanche photodiodes; germanium radiation detectors; liquid scintillation detectors; nuclear electronics; photocathodes; photomultipliers; readout electronics; CDEX; China Dark matter EXperiments; CsI; HPGe target detector; VUV detector; electric field; experiment verification; gaseous avalanche photomultipliers; liquid Ar; low temperature working environment; optimized thinner THGEM; photocathode; radioactivity; scintillation detector; scintillation light; size 0.2 mm; vacuum evaporation; vacuum ultraviolet light; veto detector; working conditions;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
Conference_Location
Anaheim, CA
ISSN
1082-3654
Print_ISBN
978-1-4673-2028-3
Type
conf
DOI
10.1109/NSSMIC.2012.6551283
Filename
6551283
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