• DocumentCode
    2548752
  • Title

    Bayesian sequential control charts for monitoring multivariate processes

  • Author

    Zhu, H.M. ; Wang, Y.H. ; Hao, L.Y. ; Zeng, Z.F. ; Liu, Z.H.

  • Author_Institution
    Coll. of Bus. Adm., Hunan Univ., Changsha, China
  • fYear
    2009
  • fDate
    21-23 Oct. 2009
  • Firstpage
    1093
  • Lastpage
    1097
  • Abstract
    The control charts are an effective tool to enhance quality in industrial sectors. To make full use of the sample´ information in different stages and consider the parameter uncertainty risk in statistical process control, this paper introduces a reference prior distribution for the parameters in quality models, and constructs control with the warning limits and control limits in terms of the quality variables´ predictive distributions as well as the relationship between the multivariate student t distribution and F distribution, monitoring the variables change in processes. When the current stage is under statistical control, the parametric posterior distribution is considered to be their priori distribution in the next stage, by which an sequential Bayesian multivariate control approach is established.
  • Keywords
    Bayes methods; control charts; process monitoring; statistical process control; Bayesian sequential control charts; control limits; industrial sectors; multivariate processes monitoring; multivariate student F distribution; multivariate student t distribution; parametric posterior distribution; quality enhancement; quality variable predictive distributions; sequential Bayesian multivariate control; statistical process control; warning limits; Bayesian methods; Contracts; Control charts; Costs; Frequency; Monitoring; Supply chain management; Supply chains; Testing; Uncertainty; Bayesian analysis; Quality management; multivariate student t distribution; process control; warning lines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Engineering and Engineering Management, 2009. IE&EM '09. 16th International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-3671-2
  • Electronic_ISBN
    978-1-4244-3672-9
  • Type

    conf

  • DOI
    10.1109/ICIEEM.2009.5344398
  • Filename
    5344398