DocumentCode
2548900
Title
Quality control scheme with learning effect consideration
Author
Yang, Ling ; Wang, Yuh-Rau
Author_Institution
St. John´´s Univ., Taipei
fYear
2007
fDate
7-10 Oct. 2007
Firstpage
2889
Lastpage
2893
Abstract
This work identifies a link between quality control scheme and the learning effect caused by the quality improvement program. The reduction rate of process standard deviation may be large during the initial stage of the quality improvement program, and influences the construction of control chart. Simulation is used to evaluate the performance of the control charts. The EWMA mean control chart with consideration of learning curve performs best. The Shewhart mean control chart without learning curve consideration has almost no detection ability when the shift magnitude of the process mean is small.
Keywords
control charts; learning systems; quality control; total quality management; Shewhart mean control chart; learning effect; process standard deviation; quality control; quality improvement program; Control charts; Costs; Investments; Manufacturing; Monitoring; Predictive models; Quality control; System performance; Total quality management; Waste reduction;
fLanguage
English
Publisher
ieee
Conference_Titel
Systems, Man and Cybernetics, 2007. ISIC. IEEE International Conference on
Conference_Location
Montreal, Que.
Print_ISBN
978-1-4244-0990-7
Electronic_ISBN
978-1-4244-0991-4
Type
conf
DOI
10.1109/ICSMC.2007.4414130
Filename
4414130
Link To Document