Title :
MOS-gated Thyristors (MCTs) For High Power Switching
Author :
Bayne, S.B. ; Portnoy, W.M. ; Rohwein, G.J. ; Hudgins, J.L.
Author_Institution :
Department of Electrical Engineering, Texas Tech University
Keywords :
Capacitors; Circuit testing; Driver circuits; Inductance; MOSFETs; Power semiconductor switches; Pulse circuits; Thyristors; Voltage; Wires;
Conference_Titel :
Power Modulator Symposium, 1994., Twenty-First International
DOI :
10.1109/MODSYM.1994.597046
