• DocumentCode
    2549201
  • Title

    Application of the measured equation of invariance to transmission lines and discontinuities

  • Author

    Prouty, M.D. ; Pous, R. ; Mei, K.M. ; Schwarz, S.E.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
  • fYear
    1993
  • fDate
    June 28 1993-July 2 1993
  • Firstpage
    280
  • Abstract
    The MEI (measured equation of invariance) method can easily be applied to static analyses of uniform transmission lines, such as single and coupled microstrip lines. Laplace´s equation is solved for the static electric potential, and the total charges on the metal structures are found. Solving the problem with the correct permittivity values for the dielectrics yields the capacitance of the structures, while solving the problem with all permittivities equal to the free-space value yields the inductances. The quasi-static impedance values may then be obtained. Planar microstrip-type structures, where currents are confined to two dimensions are also considered. Results are presented for cases where no dielectric is present. This simplifies the Green´s function calculation for the present purposes, but the method may be applied to more general cases.<>
  • Keywords
    Green´s function methods; Laplace equations; capacitance; electric potential; finite element analysis; inductance; invariance; microstrip discontinuities; permittivity; planar waveguides; transmission line theory; Green´s function calculation; Laplace´s equation; capacitance; charges; coupled microstrip lines; discontinuities; inductances; measured equation of invariance; permittivities; quasi-static impedance; static electric potential; uniform transmission lines; Capacitance; Couplings; Dielectrics; Electric potential; Green´s function methods; Impedance; Laplace equations; Microstrip; Permittivity measurement; Transmission line measurements;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 1993. AP-S. Digest
  • Conference_Location
    Ann Arbor, MI, USA
  • Print_ISBN
    0-7803-1246-5
  • Type

    conf

  • DOI
    10.1109/APS.1993.385350
  • Filename
    385350