• DocumentCode
    2549607
  • Title

    CPW self-resetting power limiting devices based on microwave power induced semiconductor-metal transition in vanadium dioxide

  • Author

    Givernaud, Julien ; Crunteanu, Aurelian ; Pothier, Arnaud ; Champeaux, Corinne ; Catherinot, Alain ; Blondy, Pierre

  • Author_Institution
    CNRS, Univ. de Limoges, Limoges, France
  • fYear
    2009
  • fDate
    7-12 June 2009
  • Firstpage
    109
  • Lastpage
    112
  • Abstract
    We present a novel concept of microwave power limiting devices (reversible self-resetting fuses and power limiters) based on reversible semiconductor-to-metal transition (SMT) of vanadium dioxide thin films integrated on coplanar waveguide transmission lines (CPW). We designed, simulated and fabricated devices which can be reversibly driven from a low-loss (<0.7 dB) transmission state into a high-loss state (attenuation higher than 32 dB from 100 MHz to 40 GHz) as the VO2 material is changing from semiconductor to metal when the incident microwave power exceed a threshold value. These simple devices can be easily integrated as broadband protection circuits from excess power or DC transients for a large variety of RF and microwave components.
  • Keywords
    coplanar waveguides; microwave limiters; thin film devices; transmission line theory; vanadium compounds; RF components; broadband protection circuits; coplanar waveguide transmission lines; frequency 100 MHz to 40 GHz; microwave components; microwave power induced semiconductor-metal transition; microwave power limiting devices; reversible selfresetting fuses; reversible semiconductor-to-metal transition; vanadium dioxide thin films; Coplanar transmission lines; Coplanar waveguides; Fuses; Microwave devices; Power transmission lines; Semiconductor thin films; Semiconductor waveguides; Surface-mount technology; Thin film devices; Waveguide transitions; CPW waveguide; Microwave limiters; semiconductor-metal transition; vanadium dioxide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2009. MTT '09. IEEE MTT-S International
  • Conference_Location
    Boston, MA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4244-2803-8
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2009.5165644
  • Filename
    5165644