DocumentCode
2549684
Title
Analysis of the drift velocity of the Silicon Drift Detector for ALICE experiment
Author
Kushpil, S.
Author_Institution
Nucl. Phys. Inst., Rez near Prague, Czech Republic
fYear
2012
fDate
Oct. 27 2012-Nov. 3 2012
Firstpage
1349
Lastpage
1352
Abstract
Silicon Drift Detectors (SDD) equip the two intermediate layers of the Inner Tracking System (ITS) of the ALICE experiment. The SDD is required to provide a spatial precision of about 35 μm along the drift direction and 25 μm along the anode axis. In these detectors, the drift velocity depends on temperature (ν ∝ T-2.4), giving a 0.8%/K variation at room temperature. To achieve the required resolution on the drift coordinate, it is necessary to assure a temperature stability within 0.1 K. The drift velocity is determined by measuring the drift time of electrons injected in the sensor volume in fixed positions by means of dedicated MOS devices (injectors). We report the current calibration strategy, the operational experience and the injector performance during the 2010-12 data taking period. Studies of drift velocity stability as a function of time were carried out in different periods and for two different configurations of the SDD cooling system. We also show the results of a study of the time needed to stabilize the temperature after ramping up the detector high voltage. This measurement is important for the detector operation because the high voltage is ramped down and up at each LHC fill during the beam injection.
Keywords
calibration; particle beam injection; silicon radiation detectors; transition radiation detectors; ALICE experiment; SDD cooling system; anode axis; beam injection; current calibration strategy; dedicated MOS devices; drift coordinate; drift direction; drift velocity analysis; electron drift time; inner tracking system; room temperature; sensor volume; silicon drift detector; temperature stability;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
Conference_Location
Anaheim, CA
ISSN
1082-3654
Print_ISBN
978-1-4673-2028-3
Type
conf
DOI
10.1109/NSSMIC.2012.6551329
Filename
6551329
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