• DocumentCode
    2549753
  • Title

    Modeling and analyzing repairable safety-critical series-parallel system

  • Author

    Sun, Qing ; Chen, Gong

  • Author_Institution
    Sch. of Manage. & Econ., Beijing Inst. of Technol., Beijing, China
  • fYear
    2009
  • fDate
    21-23 Oct. 2009
  • Firstpage
    1250
  • Lastpage
    1254
  • Abstract
    The repairable safety-critical series-parallel system has working, fail-safe, and fail-dangerous states. This paper studies the repairable safety-critical series-parallel system by considering its component lifetime possessing general distribution. We first respectively derive the reliability and safety indices of the system including probabilities that the system in these states and mean times for the system under two different failure ways. And then the non-uniform aging model of the system is built, and two virtual age criterions are employed to study the expected repairs of the system during different aging stages of its whole operational cycle. Finally some illustrative examples are employed to show the procedures. These formulas are derived without considering component lifetime distribution assumptions, which have important meanings for improving the system reliability, safety, and maintenance.
  • Keywords
    maintenance engineering; reliability; safety; component lifetime; general distribution; nonuniform aging model; reliability; repairable safety-critical series-parallel system; safety indices; virtual age criterion; Accidents; Aging; Failure analysis; Humans; Power generation; Preventive maintenance; Reliability engineering; Safety; Sun; Time measurement; Repairable system; non-uniform aging; series-parallel system; two failures; virtual age;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Engineering and Engineering Management, 2009. IE&EM '09. 16th International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-3671-2
  • Electronic_ISBN
    978-1-4244-3672-9
  • Type

    conf

  • DOI
    10.1109/ICIEEM.2009.5344443
  • Filename
    5344443