Title :
Monolithic active pixel silicon detectors for future electron ion colliders: Status and plans
Author :
Aschenauer, E.C. ; Cole, B. ; Crowley, K.T. ; Di Ruzza, B. ; Hughes, E. ; Malinsky, D. ; Winter, Mark
Author_Institution :
Brookhaven Nat. Lab., Upton, NJ, USA
fDate :
Oct. 27 2012-Nov. 3 2012
Abstract :
More than thirty years after Quantum Chromodynamics (QCD) was first proposed as the fundamental theory of the strong force, very little is still known about the dynamical basis of hadron structure. How do these fundamental degrees of freedom dynamically generate the mass, spin, motion and spatial distribution of color charges inside hadrons? To investigate these fundamental questions a new electron-proton-lelectron-ion collider is proposed (EIC). The inner tracking system of the detectors in these colliders will require very high granularity, low material budget and, radiation hard design. In this talk, it will be shown that monolithic active pixel silicon detectors (MAPS) with sensors based on a CMOS technology satisfy all these requirements and test results will be provided. An overview will be given on eRHIC: a EIC facility designed to be realized in the Brookhaven National Laboratory, on the tests ongoing in Brookhaven National Laboratory and Columbia University on two MAPS prototype MIMOSA-26.
Keywords :
CMOS integrated circuits; electron accelerators; ion accelerators; silicon radiation detectors; Brookhaven National Laboratory; CMOS technology; Columbia University; EIC facility; MAPS prototype; MIMOSA-26; color charge mass; color charge motion; color charge spatial distribution; color charge spin; electron-ion collider; electron-proton collider; future electron ion colliders; hadron structure dynamical basis; monolithic active pixel silicon detectors; quantum Chromodynamics; radiation hard design; EIC; MAPS; MIMOSA; Microvertex Silicon Pixel Detector; eRHIC;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4673-2028-3
DOI :
10.1109/NSSMIC.2012.6551333