DocumentCode
2549788
Title
Monolithic active pixel silicon detectors for future electron ion colliders: Status and plans
Author
Aschenauer, E.C. ; Cole, B. ; Crowley, K.T. ; Di Ruzza, B. ; Hughes, E. ; Malinsky, D. ; Winter, Mark
Author_Institution
Brookhaven Nat. Lab., Upton, NJ, USA
fYear
2012
fDate
Oct. 27 2012-Nov. 3 2012
Firstpage
1370
Lastpage
1372
Abstract
More than thirty years after Quantum Chromodynamics (QCD) was first proposed as the fundamental theory of the strong force, very little is still known about the dynamical basis of hadron structure. How do these fundamental degrees of freedom dynamically generate the mass, spin, motion and spatial distribution of color charges inside hadrons? To investigate these fundamental questions a new electron-proton-lelectron-ion collider is proposed (EIC). The inner tracking system of the detectors in these colliders will require very high granularity, low material budget and, radiation hard design. In this talk, it will be shown that monolithic active pixel silicon detectors (MAPS) with sensors based on a CMOS technology satisfy all these requirements and test results will be provided. An overview will be given on eRHIC: a EIC facility designed to be realized in the Brookhaven National Laboratory, on the tests ongoing in Brookhaven National Laboratory and Columbia University on two MAPS prototype MIMOSA-26.
Keywords
CMOS integrated circuits; electron accelerators; ion accelerators; silicon radiation detectors; Brookhaven National Laboratory; CMOS technology; Columbia University; EIC facility; MAPS prototype; MIMOSA-26; color charge mass; color charge motion; color charge spatial distribution; color charge spin; electron-ion collider; electron-proton collider; future electron ion colliders; hadron structure dynamical basis; monolithic active pixel silicon detectors; quantum Chromodynamics; radiation hard design; EIC; MAPS; MIMOSA; Microvertex Silicon Pixel Detector; eRHIC;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
Conference_Location
Anaheim, CA
ISSN
1082-3654
Print_ISBN
978-1-4673-2028-3
Type
conf
DOI
10.1109/NSSMIC.2012.6551333
Filename
6551333
Link To Document