Local Performance Analysis of Clustered Faults for Shared Structures

Author

Lu, Xiao-Jun ; Li, Jian-ping

Author_Institution

Sch. of Comput. Sci. & Eng., Univ. of Electron. Sci. & Technol., Chengdu

fYear

2008

fDate

13-15 Dec. 2008

Firstpage

1

Lastpage

3

Abstract

The probabilistic diagnosis model is useful in many fields such as distributed network, digital system level testing, wafer fault testing. Some topologies and continuous defect units distributions are studied in the previous work. In this paper, we extend the model to arbitrary topology structure with share nodes and to the discrete defect distributions, such as Poission distribution and binomial distribution. The results show high identification percentage of the nodes.

Keywords

binomial distribution; fault diagnosis; graph theory; Poission distribution; arbitrary topology structure; binomial distribution; clustered faults; local performance analysis; probabilistic diagnosis model; shared structures; Clustering algorithms; Computer science; Decoding; Electronic equipment testing; Fault diagnosis; Network topology; Performance analysis; Semiconductor device modeling; System testing; Wavelet analysis; Diagnosis; local performance;

fLanguage

English

Publisher

ieee

Conference_Titel

Apperceiving Computing and Intelligence Analysis, 2008. ICACIA 2008. International Conference on

Conference_Location

Chengdu

Print_ISBN

978-1-4244-3427-5

Electronic_ISBN

978-1-4244-3426-8

Type

conf

DOI

10.1109/ICACIA.2008.4769957

Filename

4769957