Title :
Local Performance Analysis of Clustered Faults for Shared Structures
Author :
Lu, Xiao-Jun ; Li, Jian-ping
Author_Institution :
Sch. of Comput. Sci. & Eng., Univ. of Electron. Sci. & Technol., Chengdu
Abstract :
The probabilistic diagnosis model is useful in many fields such as distributed network, digital system level testing, wafer fault testing. Some topologies and continuous defect units distributions are studied in the previous work. In this paper, we extend the model to arbitrary topology structure with share nodes and to the discrete defect distributions, such as Poission distribution and binomial distribution. The results show high identification percentage of the nodes.
Keywords :
binomial distribution; fault diagnosis; graph theory; Poission distribution; arbitrary topology structure; binomial distribution; clustered faults; local performance analysis; probabilistic diagnosis model; shared structures; Clustering algorithms; Computer science; Decoding; Electronic equipment testing; Fault diagnosis; Network topology; Performance analysis; Semiconductor device modeling; System testing; Wavelet analysis; Diagnosis; local performance;
Conference_Titel :
Apperceiving Computing and Intelligence Analysis, 2008. ICACIA 2008. International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-3427-5
Electronic_ISBN :
978-1-4244-3426-8
DOI :
10.1109/ICACIA.2008.4769957