DocumentCode
2549835
Title
Waveform sampler module for J-PARC TREK experiment
Author
Igarashi, Yoichiro ; Saito, Masato
Author_Institution
Nat. High Energy Accel. Res. Organ., Tsukuba, Japan
fYear
2012
fDate
Oct. 27 2012-Nov. 3 2012
Firstpage
1376
Lastpage
1379
Abstract
A waveform sampler module has been developed for stopped kaon experiments at J-PARC. It will be applied to CsI(TI) signal readout and to drift chamber charge readout for an active muon polarimeter. The signal of the CsI(TI) photon detector has one μsec time constant, and the signal width of the active polarimeter is a few hundred nsec. The requirements for the read-out module from the experiments are high speed charge and time measurements. The readout devices should work well with a 10 kHz trigger rate. A pile-up analysis is also required for the CsI(TI) photon detector. We have adopted the wave sampling method using a flash ADC to fulfill these requirements and we have developed a new flash ADC module for this purpose. The features of this modules are, 10 bit full range, 100 MHz sampling frequency, 32 input channels, 6U VME form-factor, FPGA network engine based on a 100 Mbps network interface and event synchronization signal interface.
Keywords
analogue-digital conversion; drift chambers; field programmable gate arrays; network interfaces; nuclear electronics; polarimeters; readout electronics; signal processing; solid scintillation detectors; synchronisation; CsI(TI) photon detector; CsI(TI) signal readout; FPGA network engine; J-PARe TREK experiment; VME form-factor; active muon polarimeter; bit rate 100 Mbit/s; drift chamber charge readout; flash ADC module; frequency 100 MHz; high speed charge measurement; input channels; network interface; pile-up analysis; read-out module; readout devices; sampling frequency; signal width; synchronization signal interface; time measurement; trigger rate; wave sampling method; waveform sampler module; DAQ; FADC; Readout;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
Conference_Location
Anaheim, CA
ISSN
1082-3654
Print_ISBN
978-1-4673-2028-3
Type
conf
DOI
10.1109/NSSMIC.2012.6551335
Filename
6551335
Link To Document