DocumentCode
2549996
Title
Coplanar waveguide modeling based on scattering parameter measurements
Author
Klasovitý, M. ; Tomáa, M.
Author_Institution
Fac. of Electr. Eng. & Inf. Technol., Slovak Univ. of Technol., Bratislava, Slovakia
fYear
2002
fDate
14-16 Oct. 2002
Firstpage
239
Lastpage
242
Abstract
Presents a method for verification of important coplanar waveguide parameters. It employs a simplex optimization algorithm for transmission line model identification from on-wafer S-parameter measurements in a wide frequency range. The method was implemented in a control program for automated S-parameter measurements and applied for characterization of micromachined AlGaAs and InGaP coplanar waveguides.
Keywords
III-V semiconductors; aluminium compounds; coplanar transmission lines; coplanar waveguides; gallium arsenide; gallium compounds; indium compounds; optimisation; waveguide theory; coplanar waveguide parameters; micromachined waveguides; on-wafer S-parameter measurements; simplex optimization algorithm; transmission line model; Circuits; Coplanar waveguides; Dielectric losses; Impedance; Microelectronics; Power transmission lines; Propagation constant; Reflection; Scattering parameters; Transmission line measurements;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Semiconductor Devices and Microsystems, 2002. The Fourth International Conference on
Print_ISBN
0-7803-7276-X
Type
conf
DOI
10.1109/ASDAM.2002.1088516
Filename
1088516
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