Title :
Coplanar waveguide modeling based on scattering parameter measurements
Author :
Klasovitý, M. ; Tomáa, M.
Author_Institution :
Fac. of Electr. Eng. & Inf. Technol., Slovak Univ. of Technol., Bratislava, Slovakia
Abstract :
Presents a method for verification of important coplanar waveguide parameters. It employs a simplex optimization algorithm for transmission line model identification from on-wafer S-parameter measurements in a wide frequency range. The method was implemented in a control program for automated S-parameter measurements and applied for characterization of micromachined AlGaAs and InGaP coplanar waveguides.
Keywords :
III-V semiconductors; aluminium compounds; coplanar transmission lines; coplanar waveguides; gallium arsenide; gallium compounds; indium compounds; optimisation; waveguide theory; coplanar waveguide parameters; micromachined waveguides; on-wafer S-parameter measurements; simplex optimization algorithm; transmission line model; Circuits; Coplanar waveguides; Dielectric losses; Impedance; Microelectronics; Power transmission lines; Propagation constant; Reflection; Scattering parameters; Transmission line measurements;
Conference_Titel :
Advanced Semiconductor Devices and Microsystems, 2002. The Fourth International Conference on
Print_ISBN :
0-7803-7276-X
DOI :
10.1109/ASDAM.2002.1088516
