Broadband capacitive sensor CMOS interface circuit for dielectric spectroscopy

Author

Daphtary, Milan ; Sonkusale, Sameer

Author_Institution

Dept. of Electr. Eng., Tufts Univ., Medford, MA

fYear

2006

fDate

21-24 May 2006

Lastpage

4288

Abstract

A broadband current-mode interface circuit performing capacitive measurements suitable for implementation in CMOS technology is suggested. A capacitance change in the sensor capacitor translates uniformly into a DC voltage change at the output over a broad frequency range (1M~1G). This wideband operation enables the performance of broadband dielectric spectroscopy measurements. The circuit has been shown to have a capacitance resolution of 0.7fF and dynamic range of 500fF. It has been designed in 0.18mum CMOS technology and consumes 10.46mW of power at a power supply of +/-1 V

Keywords

CMOS integrated circuits; capacitive sensors; spectrometers; spectroscopy; 0.18 micron; 0.7 fF; 1 V; 10.46 mW; CMOS interface circuit; CMOS technology; broadband capacitive sensor; broadband dielectric spectroscopy; capacitive measurements; current-mode interface circuit; CMOS technology; Capacitance; Capacitive sensors; Capacitors; Circuits; Current measurement; Dielectric measurements; Electrochemical impedance spectroscopy; Performance evaluation; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 2006. ISCAS 2006. Proceedings. 2006 IEEE International Symposium on

Conference_Location

Island of Kos

Print_ISBN

0-7803-9389-9

Type

conf

DOI

10.1109/ISCAS.2006.1693576

Filename

1693576