DocumentCode :
2550070
Title :
Crosstalk analysis in CMOS integrated circuits
Author :
Novák, Jan ; Foit, Julius
Author_Institution :
Dept. of Microelectron., Czech Tech. Univ., Prague, Czech Republic
fYear :
2002
fDate :
14-16 Oct. 2002
Firstpage :
251
Lastpage :
254
Abstract :
The ICs in LSI technology require multilayer connecting-lead systems employing large leads density, diminishing the physical distance between individual leads. The small lead-to-lead separation results increased crosstalk effects inside the integrated circuits. A method was designed to facilitate the forecast of crosstalks in integrated circuits using simple passive LCR circuit models of connecting lines. It appears possible, given a well defined standard interconnecting technology, to forecast the maximum value of crosstalk in a digital system regardless of the physical length of the mutually interfering leads. This presents a major design advantage since the maximum crossialk value can be determined using simple equations without any need to pe form circuit simulations of digital systems including the influence of parasitic couplings. The application of these limit cases can speed up considerably the design of electromagnetically compatible electronic systems.
Keywords :
CMOS integrated circuits; crosstalk; integrated circuit interconnections; large scale integration; CMOS integrated circuits; LSI technology; crosstalk; electromagnetically compatible electronic systems; interconnecting technology; lead-lead separation; multilayer connecting-lead systems; CMOS integrated circuits; CMOS technology; Crosstalk; Design methodology; Digital systems; Integrated circuit modeling; Integrated circuit technology; Large scale integration; Nonhomogeneous media; Predictive models;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Semiconductor Devices and Microsystems, 2002. The Fourth International Conference on
Print_ISBN :
0-7803-7276-X
Type :
conf
DOI :
10.1109/ASDAM.2002.1088519
Filename :
1088519
Link To Document :
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