Title :
Single-chip time-to-digital converter with 10 ps resolution, 160 ns dynamic range, and 1% LSB DNL
Author :
Markovic, Branko ; Tamborini, Davide ; Villa, Federica ; Tosi, Alberto
Author_Institution :
Dipt. di Elettron. e Inf., Politec. di Milano, Milan, Italy
fDate :
Oct. 27 2012-Nov. 3 2012
Abstract :
We present a low-power Time-to-Digital Converter (TDC) chip, fabricated in a standard cost-effective 0.35 μm CMOS technology, that provides 160 ns dynamic range, 10 ps resolution and Differential Non-Linearity better than 0.01 LSB rms. This chip is the core of a compact TDC module, provided with an USB 2.0 interface for user-friendly control and data-acquisition. The TDC chip consumes just 80 mW and enables the development of power-effective, ultra-compact TDC array chips for multi-channel timing boards. The TDC is suitable for a wide variety of applications such as: Time-of-Flight (TOF) Positron Emission Tomography (PET), picoseconds timings of nuclear events, Fluorescence Lifetime Imaging (FLIM), 3D ranging measurements, time-resolved spectroscopy, Diffuse Optical Tomography (DOT), Optical Time-Domain Reflectometry (OTDR), quantum optics, etc.
Keywords :
CMOS integrated circuits; integrated circuit manufacture; low-power electronics; time-digital conversion; 3D ranging measurements; CMOS; FLIM; LSB DNL; USB 2.0 interface; data-acquisition; differential non-linearity; diffuse optical tomography; fluorescence lifetime imaging; low-power time-to-digital converter chip; multi-channel timing boards; nuclear events picoseconds timings; optical time-domain reflectometry; power 80 mW; quantum optics; single-chip time-to-digital converter; size 0.35 mum; time 10 ps; time 160 ns; time-of-flight positron emission tomography; time-resolved spectroscopy; user-friendly control;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4673-2028-3
DOI :
10.1109/NSSMIC.2012.6551350