Elimination of PCB test damages by strict parameter control

The effects of various voltage and current stimulus levels on fine-line bare boards, hybrids, and substrates are examined. The need for strict control of these parameters in order not to degrade or destroy the foundation upon which most complex and expensive circuits are built is illustrated. The impact of test stimulus voltage on both conductor integrity and isolation resistance is explored, along with the economic effects that can result from less than optimum testing strategies and parameters