DocumentCode
2550744
Title
Broadband equivalent circuit derivation for multi-port circuits based on eigen-state formulation
Author
Wane, Sidina ; Bajon, Damienne
Author_Institution
NXP-Semicond., Caen, France
fYear
2009
fDate
7-12 June 2009
Firstpage
305
Lastpage
308
Abstract
In this paper a passive guaranteed wide-band equivalent circuit derivation methodology, attempting to bridge physical geometry considerations with equivalent circuits model extractions, is proposed. Electromagnetic (EM) eigen-states formulation is introduced to bridge between physical topology (geometry) and equivalent network architectures. Instead of casting global Z or Y parameters in pole-residue expansions following Pi or T-networks, the proposed methodology considers eigen-states input impedances/admittances as primary goal functions to derive in canonical equivalent circuit models. While classical Pi or T representations are based on global ground assumptions, the proposed methodology refers to local ground references. The validity of the broadband extraction methodology is demonstrated through correlations with RF measurement carried out on CPW transmission lines and coupled RF inductors up to very high frequencies.
Keywords
eigenvalues and eigenfunctions; equivalent circuits; network topology; passive networks; CPW transmission line; RF inductor; RF measurement; T-network; admittance; broadband equivalent circuit derivation; eigenstates input impedance; electromagnetic eigenstates formulation; equivalent circuits model extraction; equivalent network architectures; layout topology; multiport circuit; physical topology; pole-residue expansion; wideband equivalent circuit derivation methodology; Bridge circuits; Casting; Circuit topology; Equivalent circuits; Geometry; Impedance; Network topology; Radio frequency; Solid modeling; Wideband; Bridge/Trellis topology; Layout topology; Mittag-Leffler; Modal-States; Passivity Preservation;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 2009. MTT '09. IEEE MTT-S International
Conference_Location
Boston, MA
ISSN
0149-645X
Print_ISBN
978-1-4244-2803-8
Electronic_ISBN
0149-645X
Type
conf
DOI
10.1109/MWSYM.2009.5165694
Filename
5165694
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