DocumentCode :
2550972
Title :
Fact description based on rough sets for expert system
Author :
Miao, Jiajia ; Yin, XiaoHu ; Chen, Guoyou ; Li, Aiping ; Yuan, Zhijian
Author_Institution :
Inst. of Command Autom., PLA Univ. of Sci. & Technol., Nanjing, China
fYear :
2010
fDate :
16-18 April 2010
Firstpage :
293
Lastpage :
297
Abstract :
Fault diagnosis expert system is wide used in the maintenance application fields. And knowledge acquisition is the key technology of expert system development. For the equipment maintenance domain, systems typically require a very long period to acquire knowledge, and knowledge is not necessarily correct. To address this issue, we describe the relationship between rough set theory and rule-based description of equipment failures. Then the exclusive rules, inclusive rules and failure images of equipment are built based on the EMES (Equipment Maintenance Expert System) diagnosis model, and the definition of probability rule is put forward. Next, we present the rule-based automated induction reasoning method and resampling methods. We also introduce automated induction of the rule-based description, which is used in our EMES. Finally, the experimental results show our solution gives a very suitable framework to represent processes of uncertain knowledge extraction.
Keywords :
expert systems; fault diagnosis; knowledge acquisition; maintenance engineering; rough set theory; equipment maintenance expert system; fact description; fault diagnosis expert system; induction reasoning method; knowledge acquisition; maintenance application fields; resampling methods; rough sets; rule based equipment failures description; uncertain knowledge extraction; Diagnostic expert systems; Displays; Equipment failure; Expert systems; Knowledge acquisition; Knowledge management; Rough sets; Set theory; Visual databases; Web server; expert system; fact description; knowledge acquisition; rough set;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Management and Engineering (ICIME), 2010 The 2nd IEEE International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-5263-7
Electronic_ISBN :
978-1-4244-5265-1
Type :
conf
DOI :
10.1109/ICIME.2010.5477940
Filename :
5477940
Link To Document :
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