A numerical simulation of scattering from an inhomogeneous random surface

An efficient numerical solution for the scattering problem of a single dielectric hump over an impedance surface has recently been presented using the exact image theory. This solution is used to compute the scattered field of a finite number of dielectric humps which constitute the rough top layer of the bare soil surface, summing the scatter from all constituent humps coherently. The statistical behavior of the scattering coefficient can be obtained by performing many different realizations of the surface. In the present work, the authors consider one functional form for the dielectric humps and compute the surface statistical parameters, such as RMS (root mean square) height and correlation length, directly from the surface realizations.<>