DocumentCode :
2551028
Title :
Likelihood analysis of beam data for time of propagation counter
Author :
Arita, Yoshihiko
Author_Institution :
Dept. of Phys., Nagoya Univ., Nagoya, Japan
fYear :
2012
fDate :
Oct. 27 2012-Nov. 3 2012
Firstpage :
1626
Lastpage :
1629
Abstract :
We, Belle II PID group, present about analysis method and the obtained performance of particle identification (PID) for Time Of Propagation (TOP) counter using 120 GeV/c pion beam at CERN. We used the prototype of the TOP counter with focusing mirror. The TOP counter is a new detector of PID for barrel region at Belle II detector. The TOP counter is a kind of Ring Imaging Cherenkov counter (RICH), which detects internally reflected Cherenkov light, like a DIRC [1]. TOP counter reconstructs the velocity of particle "beta" from 3D Cherenkov ring image. The ring image consists of position and timing of detected photons. To evaluate the performance of TOP counter, we have to understand fine structures of ring image using experimental data. We can calculate the likelihood from Probability Density Function (PDF) provided by Monte Carlo (MC) simulation. We aligned the incident condition of particle and the time offset using maximum likelihood estimation successfully. Then, beta is evaluated by same method event by event. As a result, we obtained the beta resolutionσβ = 2.2 × 10-3.
Keywords :
Cherenkov counters; Cherenkov radiation; Monte Carlo methods; maximum likelihood estimation; mirrors; photodetectors; statistical distributions; 3D Cherenkov ring image; Belle II PID group; Belle II detector; CERN; DIRC; Monte Carlo simulation; TOP counter; analysis method; barrel region; beam data; beta resolution; focusing mirror; incident condition; internally reflected Cherenkov light; likelihood analysis; maximum likelihood estimation; particle identification; particle velocity; pion beam; probability density function; ring imaging Cherenkov counter; time of propagation counter;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
Conference_Location :
Anaheim, CA
ISSN :
1082-3654
Print_ISBN :
978-1-4673-2028-3
Type :
conf
DOI :
10.1109/NSSMIC.2012.6551387
Filename :
6551387
Link To Document :
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