Title :
Full wave multiple scattering from one dimensional random rough surfaces and high frequency stationary phase approximation
Author :
Bahar, E. ; El-Shenawee, M.
Author_Institution :
Electr. Eng. Dept., Nebraska Univ., Lincoln, NE, USA
fDate :
June 28 1993-July 2 1993
Abstract :
Using the full wave approach, integral expressions for the double scattered radar cross sections are given. The rough surface is assumed to be characterized by a Gaussian joint probability density function for the surface heights and slopes at two points. The surface height autocorrelation function and its Fourier transform are also assumed to be Gaussian. The expressions for the double scattered cross section are expressed as six-dimensional integrals which account for the correlations between the heights and the slopes of the random rough surface. The stationary phase approximation is used to reduce the expressions for the double scattered cross section from six to two dimensional integrals. For the stationary phase approximations to the full wave solutions it is not necessary to assume Gaussian joint probability density functions or Gaussian surface height autocorrelation functions. It is shown that enhanced backscatter is due to double scatter when the rough surface mean square slopes and heights are large.<>
Keywords :
Gaussian distribution; backscatter; electromagnetic wave scattering; radar cross-sections; Gaussian joint probability density function; double scattered radar cross sections; enhanced backscatter; full wave solutions; multiple scattering; one dimensional random rough surfaces; six-dimensional integrals; stationary phase approximation; surface height autocorrelation function; Autocorrelation; Fourier transforms; Frequency; Polarization; Probability density function; Radar cross section; Radar scattering; Rough surfaces; Surface roughness; Surface waves;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1993. AP-S. Digest
Conference_Location :
Ann Arbor, MI, USA
Print_ISBN :
0-7803-1246-5
DOI :
10.1109/APS.1993.385436