Title :
Effective polarized backscattering coefficients of a slightly rough surface to an EM beam
Author :
Zhou, J. ; Fang, D.-G.
Author_Institution :
East China Inst. of Tech., Nanjing, China
fDate :
June 28 1993-July 2 1993
Abstract :
Analytical expressions of new effective like- and cross-polarized backscattering coefficients of a randomly slightly rough dielectric surface for an incident beam are given. They are the sum of the small perturbation solution as the beam is approximated as a plane wave and one or two modifying items resulting from the divergence of ray directions within the angle-width of the incident beam. For the like-polarizing case, one can usually neglect the angle-width effect of the beam, i.e., their two modifying items; for the cross-polarizing case one cannot. The results of numerical comparison of the new and previous theories with measurement for a randomly slightly rough soil surface support the new theory developed here. More direct experimental verification of the theory is expected to appear soon.<>
Keywords :
backscatter; electromagnetic wave scattering; perturbation techniques; soil; divergence of ray directions; plane wave; polarized backscattering coefficients; randomly slightly rough soil surface; small perturbation solution; Azimuth; Backscatter; Dielectric measurements; Geometry; Polarization; Radar measurements; Rough surfaces; Scattering parameters; Surface roughness; Surface waves;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1993. AP-S. Digest
Conference_Location :
Ann Arbor, MI, USA
Print_ISBN :
0-7803-1246-5
DOI :
10.1109/APS.1993.385437