DocumentCode
2551247
Title
Application of incremental length diffraction coefficients to calculate the pattern effects of the rim and surface cracks of a reflector antenna
Author
Shore, R.A. ; Yaghjian, A.D.
Author_Institution
Rome Lab., Hanscom AFB, MA, USA
fYear
1993
fDate
June 28 1993-July 2 1993
Firstpage
1350
Abstract
The authors demonstrate the importance of incremental length diffraction coefficients (ILDCs) for accurately calculating the pattern of reflector antennas and for investigating the effect of cracks on the surfaces that can result from the imperfect fitting together of panels to form a large reflector. The three models of cracks considered here are 1) an infinitely long slit in a PEC (perfectly electrically conducting) screen, 2) an infinitely long channel with a semicircular cross section in a PEC screen; 3) an infinitely long boss (ridge) with a semicircular cross section in a PEC screen. Significant pattern effects of the cracks are found depending on the crack model and on the orientation of the cracks.<>
Keywords
antenna radiation patterns; cracks; physical theory of diffraction; reflector antennas; crack model; imperfect fitting; incremental length diffraction coefficients; pattern effects; reflector antenna; rim cracks; surface cracks; Aperture antennas; Electromagnetic diffraction; Laboratories; Optical computing; Physical optics; Physics computing; Reflector antennas; Scattering; Surface cracks; Surface fitting;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium, 1993. AP-S. Digest
Conference_Location
Ann Arbor, MI, USA
Print_ISBN
0-7803-1246-5
Type
conf
DOI
10.1109/APS.1993.385444
Filename
385444
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