DocumentCode :
2551247
Title :
Application of incremental length diffraction coefficients to calculate the pattern effects of the rim and surface cracks of a reflector antenna
Author :
Shore, R.A. ; Yaghjian, A.D.
Author_Institution :
Rome Lab., Hanscom AFB, MA, USA
fYear :
1993
fDate :
June 28 1993-July 2 1993
Firstpage :
1350
Abstract :
The authors demonstrate the importance of incremental length diffraction coefficients (ILDCs) for accurately calculating the pattern of reflector antennas and for investigating the effect of cracks on the surfaces that can result from the imperfect fitting together of panels to form a large reflector. The three models of cracks considered here are 1) an infinitely long slit in a PEC (perfectly electrically conducting) screen, 2) an infinitely long channel with a semicircular cross section in a PEC screen; 3) an infinitely long boss (ridge) with a semicircular cross section in a PEC screen. Significant pattern effects of the cracks are found depending on the crack model and on the orientation of the cracks.<>
Keywords :
antenna radiation patterns; cracks; physical theory of diffraction; reflector antennas; crack model; imperfect fitting; incremental length diffraction coefficients; pattern effects; reflector antenna; rim cracks; surface cracks; Aperture antennas; Electromagnetic diffraction; Laboratories; Optical computing; Physical optics; Physics computing; Reflector antennas; Scattering; Surface cracks; Surface fitting;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium, 1993. AP-S. Digest
Conference_Location :
Ann Arbor, MI, USA
Print_ISBN :
0-7803-1246-5
Type :
conf
DOI :
10.1109/APS.1993.385444
Filename :
385444
Link To Document :
بازگشت