• DocumentCode
    2551247
  • Title

    Application of incremental length diffraction coefficients to calculate the pattern effects of the rim and surface cracks of a reflector antenna

  • Author

    Shore, R.A. ; Yaghjian, A.D.

  • Author_Institution
    Rome Lab., Hanscom AFB, MA, USA
  • fYear
    1993
  • fDate
    June 28 1993-July 2 1993
  • Firstpage
    1350
  • Abstract
    The authors demonstrate the importance of incremental length diffraction coefficients (ILDCs) for accurately calculating the pattern of reflector antennas and for investigating the effect of cracks on the surfaces that can result from the imperfect fitting together of panels to form a large reflector. The three models of cracks considered here are 1) an infinitely long slit in a PEC (perfectly electrically conducting) screen, 2) an infinitely long channel with a semicircular cross section in a PEC screen; 3) an infinitely long boss (ridge) with a semicircular cross section in a PEC screen. Significant pattern effects of the cracks are found depending on the crack model and on the orientation of the cracks.<>
  • Keywords
    antenna radiation patterns; cracks; physical theory of diffraction; reflector antennas; crack model; imperfect fitting; incremental length diffraction coefficients; pattern effects; reflector antenna; rim cracks; surface cracks; Aperture antennas; Electromagnetic diffraction; Laboratories; Optical computing; Physical optics; Physics computing; Reflector antennas; Scattering; Surface cracks; Surface fitting;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 1993. AP-S. Digest
  • Conference_Location
    Ann Arbor, MI, USA
  • Print_ISBN
    0-7803-1246-5
  • Type

    conf

  • DOI
    10.1109/APS.1993.385444
  • Filename
    385444