• DocumentCode
    2551541
  • Title

    Real 3D electro-thermal simulation and analysis for ESD protection structures

  • Author

    Xie, Haolu ; Zhan, Rouying ; Wang, Albert ; Gafiteanu, Roman

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA
  • Volume
    1
  • fYear
    2004
  • fDate
    3-5 Nov. 2004
  • Firstpage
    61
  • Lastpage
    64
  • Abstract
    This paper presents a three-dimensional electro-thermal analysis for ESD (electrostatic discharge) protection structures, aiming for accurately predicting ESD electro-thermal failure threshold and better understanding ESD protection device thermal resistance. An accurate 3D electro-thermal analysis method using real 3D TCAD simulation as presented in Taurus-process user guide (2003) and Taurus-device user guide (2003) was developed. 3D simulation was compared with experimental data using transmission line pulse (TLP) measurements for characterizing ESD protection devices. Accurate electro-thermal analysis is essential to understanding thermal behaviors of ESD protection structures under high-current stressing.
  • Keywords
    circuit simulation; electrostatic discharge; technology CAD (electronics); thermal analysis; transmission line theory; 3D TCAD simulation; 3D electro-thermal simulation; ESD protection structures; device thermal resistance; electro-thermal failure threshold; electrostatic discharge; high-current stressing; transmission line pulse measurements; Analytical models; Electrical resistance measurement; Electrostatic analysis; Electrostatic discharge; Failure analysis; Protection; Pulse measurements; Thermal resistance; Thermal stresses; Transmission line measurements;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Devices, Circuits and Systems, 2004. Proceedings of the Fifth IEEE International Caracas Conference on
  • Print_ISBN
    0-7803-8777-5
  • Type

    conf

  • DOI
    10.1109/ICCDCS.2004.1393354
  • Filename
    1393354