DocumentCode :
2551674
Title :
Charge-focusing readout of time projection chambers
Author :
Ross, S.J. ; Hedges, M.T. ; Jaegle, I. ; Rosen, M.D. ; Seong, I.S. ; Thorpe, T.N. ; Vahsen, S.E. ; Yamaoka, J.
Author_Institution :
Univ. of Hawaii, Honolulu, HI, USA
fYear :
2012
fDate :
Oct. 27 2012-Nov. 3 2012
Firstpage :
1760
Lastpage :
1765
Abstract :
Time projection chambers (TPCs) have found a wide range of applications in particle physics, nuclear physics, and homeland security. For TPCs with high-resolution readout, the readout electronics often dominate the price of the final detector. We have developed a novel method which could be used to build large-scale detectors while limiting the necessary readout area. By focusing the drift charge with static electric fields, we would allow a small area of electronics to be sensitive to particle detection for a much larger detector volume. The resulting cost reduction could be important in areas of research which demand largescale detectors, including dark matter searches and detection of special nuclear material. We present simulations made using the software package Garfield of a focusing structure to be used with a prototype TPC with pixel readout. This design should enable significant focusing while retaining directional sensitivity to incoming particles. We also present first experimental results and compare them with simulation.
Keywords :
nuclear electronics; readout electronics; time projection chambers; charge-focusing readout; cost reduction; dark matter detection; dark matter searches; detector volume; directional sensitivity; drift charge; focusing structure; high-resolution readout; homeland security; large-scale detectors; nuclear physics; particle detection; particle physics; pixel readout; prototype TPC; readout area; readout electronics; software package Garfield; special nuclear material; static electric fields; time projection chambers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
Conference_Location :
Anaheim, CA
ISSN :
1082-3654
Print_ISBN :
978-1-4673-2028-3
Type :
conf
DOI :
10.1109/NSSMIC.2012.6551412
Filename :
6551412
Link To Document :
بازگشت