DocumentCode
2551704
Title
Studies of micromegas chambers using UV-laser-photoelectrons
Author
Temming, Kim ; Herten, Gregor ; Landgraf, Ulrich ; Mohr, Werner ; Zimmermann, S.
Author_Institution
Phys. Inst. Univ. of Freiburg, Freiburg, Germany
fYear
2012
fDate
Oct. 27 2012-Nov. 3 2012
Firstpage
1768
Lastpage
1771
Abstract
Micro Pattern Gaseous Detectors (MPGD) are a new and very promising type of gaseous detector for future experiments. Their big advantages are that they are radiation hard and also provide a spatial resolution of several microns. But at the moment, there are still unavoidable discharges occurring randomly, which reduce the achievable gain and can destroy the readout and the detector with time. This talk will present a dedicated test setup, that has been built to investigate geometries of readout structures for MPGD, in order to eliminate or minimize discharges and achieve higher rate capabilities without the application of resistive layers. The measuring principle of the test chamber is to simulate tracks of charged particles. This is done by creating photo electrons in the drift room above the MPGD on aluminum strips with the help of a UV laser. The electrons are guided by a homogenous drift field to the detector. In contrast to using particles from radioactive sources or a test beam, the spatial and temporal conditions of the electron release are very well known. The setup can be modified easily to control the point of impact of the electrons on the detector. First studies such as gain gain measurements of a Micromegas and drift velocity measurements of electrons in ArCO2 have been carried out successfully and are presented as proof of a good performance of the MPGD test chamber.
Keywords
nuclear electronics; proportional counters; radioactive sources; readout electronics; MPGD test chamber; UV laser; UV-laser-photoelectrons; aluminum strips; drift room; drift velocity measurements; electron release; gain measurements; gaseous detector; micromegas chamber studies; micropattern gaseous detectors; photoelectrons; radiation hardness; radioactive sources; resistive layers; spatial conditions; temporal conditions; test beam; test chamber;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
Conference_Location
Anaheim, CA
ISSN
1082-3654
Print_ISBN
978-1-4673-2028-3
Type
conf
DOI
10.1109/NSSMIC.2012.6551414
Filename
6551414
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