DocumentCode
2551800
Title
Simulation of a small feature gauging system using phase-shift projection moiré topography
Author
Li, Nan
Author_Institution
Inf. Eng. Teaching & Res. Sect., People´´s Armed Police Force Acad. of China, Langfang, China
fYear
2010
fDate
16-18 April 2010
Firstpage
366
Lastpage
369
Abstract
Although phase-shift moiré topography is considered as a promising technique for the three dimension measurement and inspection of the parts of small feature size in industry, it has not been widely put into practice because designing such a system to meet the specific inspection task requirements could be difficult. In this paper, a scheme of a small feature gauging system based on phase-shift moiré topography is proposed and its mathematical model is deduced. A simulation design package is also developed to determine the feasible range of the design parameters according to the design requirements as well as to evaluate the system performance. The simulation results verify the mathematical model of this gauging system and show that the design process of the small feature gauging system can be greatly simplified with this simulation package.
Keywords
displacement measurement; gauges; moire fringes; surface reconstruction; 3D measurement; phase-shift projection moire topography; small feature gauging system; Design engineering; Force measurement; Gratings; Inspection; Lenses; Mathematical model; Optical surface waves; Packaging; Surface topography; System performance; feature gauging system; moiré topography; phase-shift;
fLanguage
English
Publisher
ieee
Conference_Titel
Information Management and Engineering (ICIME), 2010 The 2nd IEEE International Conference on
Conference_Location
Chengdu
Print_ISBN
978-1-4244-5263-7
Electronic_ISBN
978-1-4244-5265-1
Type
conf
DOI
10.1109/ICIME.2010.5477975
Filename
5477975
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