Title :
A comparative study of pseudo stuck-at and leakage fault model
Author :
Zachariah, Sujit Thomas ; Chakravarty, Sreejit
Author_Institution :
Dept. of Comput. Sci. & Eng., State Univ. of New York, Buffalo, NY, USA
Abstract :
Pseudo stuck-at is a popular model, used by many commercial tool vendors, for evaluating and selecting IDDQ tests. We show that pseudo stuck-at fault coverage numbers are very pessimistic, and equally good vectors can be selected much faster using the leakage fault model. This, and the fact that a fast simulation algorithm exists for leakage faults, prompts us to propose the use of the leakage fault model
Keywords :
fault simulation; integrated circuit modelling; integrated circuit testing; IDDQ testing; leakage fault model; pseudo stuck-at fault model; simulation algorithm; Bridge circuits; Circuit faults; Circuit simulation; Circuit testing; Computer science; Current measurement; Current supplies; Insulation; Manufacturing; Steady-state;
Conference_Titel :
VLSI Design, 1999. Proceedings. Twelfth International Conference On
Conference_Location :
Goa
Print_ISBN :
0-7695-0013-7
DOI :
10.1109/ICVD.1999.745130
