Title :
A new test compression scheme
Author :
Bhaumik, Basabi ; Visweswaran, G.S. ; Lakshminarasimhan, R.
Author_Institution :
Dept. of Electr. Eng., Indian Inst. of Technol., New Delhi, India
Abstract :
Generalized Modified Positional Syndrome (GMPS), of order p, a new compaction scheme for test output data is presented. The order p determines the aliasing probability and the amount of hardware overhead required to implement the scheme. GMPS of order two gives an aliasing probability about an order of magnitude lower than the best scheme reported in literature with minimal extra hardware. A hardware realization scheme for GMPS has been presented. The scheme uses adders with feedback
Keywords :
adders; circuit feedback; data compression; integrated circuit testing; Generalized Modified Positional Syndrome; adder; aliasing probability; data compaction; feedback; hardware overhead; test compression; Airports; Circuit testing; Compaction; Data compression; Hardware; Integrated circuit testing; Satellites; Semiconductor device measurement;
Conference_Titel :
VLSI Design, 1999. Proceedings. Twelfth International Conference On
Conference_Location :
Goa
Print_ISBN :
0-7695-0013-7
DOI :
10.1109/ICVD.1999.745131
