DocumentCode :
2552063
Title :
A MoM Based Semi-Deterministic Approach for Modelling Scattering from Building Faces
Author :
Mahmood, Kashif ; Rafiq, Gulzaib ; Mughal, M. Junaid
Author_Institution :
Fac. of Electron. Eng., GIK Inst. of Eng. Sci. & Technol.
fYear :
2006
fDate :
23-24 Dec. 2006
Firstpage :
373
Lastpage :
376
Abstract :
The prediction accuracy of a propagation model depends on two factors; the exactness of the input data (environmental database) and the ability of the prediction tool to correctly model the available information. As the current databases used in propagation prediction tools do not provide environmental details on the wavelength scale, hence an alternate solution comprising of semi-deterministic technique is used in which walls and windows/doors in the buildings are modeled as strips and slits respectively and their distribution is treated statistically. Secondly the current favourite propagation models use ray tracing technique which becomes cumbersome when dealing with multiple interaction between large number of edges. So in order to correctly model the available information method of moments (MoM) is used which takes into account all the edges present on the building faces. Channel impulse response (CIR) for scattering from building having large scale discontinuities on its face modelled semi-deterministically was calculated using MoM. Simulated CIR was validated with the actual on sight measurements and a good agreement was found
Keywords :
electromagnetic wave propagation; electromagnetic wave scattering; method of moments; ray tracing; transient response; MoM; building faces; channel impulse response; environmental database; method of moments; propagation model; propagation prediction tools; ray tracing technique; semi-deterministic approach; semideterministic technique; Accuracy; Buildings; Large-scale systems; Moment methods; Predictive models; Radio propagation; Ray tracing; Scattering; Spatial databases; Strips;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Multitopic Conference, 2006. INMIC '06. IEEE
Conference_Location :
Islamabad
Print_ISBN :
1-4244-0795-8
Electronic_ISBN :
1-4244-0795-8
Type :
conf
DOI :
10.1109/INMIC.2006.358195
Filename :
4196438
Link To Document :
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