Title :
Influence Of Electrode Geometry On The High-field Characteristics Of Photoconductive Silicon Wafers
Author :
Madangarli, V.P. ; Gradinaru, G. ; Korony, G. ; Sudarshan, T.S. ; Loubriel, G.M. ; Zutavern, F.J. ; Patterson, P.E.
Author_Institution :
Department of Electrical and Computer Engineering, University of South Carolina
Keywords :
Breakdown voltage; Contacts; Current measurement; Electrodes; Geometry; Impulse testing; Photoconductivity; Silicon; System testing; Vacuum breakdown;
Conference_Titel :
Power Modulator Symposium, 1994., Twenty-First International
DOI :
10.1109/MODSYM.1994.597060
