• DocumentCode
    2552341
  • Title

    A low noise amplifier co-designed with ESD protection circuit in 65-nm CMOS

  • Author

    Tsai, Ming-Hsien ; Hsu, Shawn S H ; Tan, Kevin K W

  • Author_Institution
    Dept. of Electr. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
  • fYear
    2009
  • fDate
    7-12 June 2009
  • Firstpage
    573
  • Lastpage
    576
  • Abstract
    By means of co-design ESD protection circuit as the low noise amplifier (LNA) input matching network, a 5.8-GHz LNA with excellent ESD and noise performances is demonstrated by a 65-nm CMOS technology. The diode-based ESD design with a power clamp can achieve 4 kV human body model (HBM) performance while the noise figure (NF) is only 0.05 dB higher than that of the LNA without the extra ESD blocks. Under a supply voltage of 1.2 V and drain current of 7 mA, the ESD-LNA has a NF of 1.9 dB with an associated power gain of 18 dB. The input third-order intercept point (IIP3) is -11 dBm and the input and output insertion losses are below -16 dB and -20 dB, respectively.
  • Keywords
    CMOS integrated circuits; MMIC amplifiers; electrostatic discharge; low noise amplifiers; CMOS technology; MMIC amplifiers; current 7 mA; electrostatic discharge protection circuit; frequency 5.8 GHz; human body model; low noise amplifier; noise figure 1.9 dB; size 65 nm; voltage 1.2 V; voltage 4 kV; CMOS technology; Circuit noise; Clamps; Diodes; Electrostatic discharge; Humans; Impedance matching; Low-noise amplifiers; Noise measurement; Protection; CMOS; ESD; Low noise amplifier; power-clamp;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2009. MTT '09. IEEE MTT-S International
  • Conference_Location
    Boston, MA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4244-2803-8
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2009.5165761
  • Filename
    5165761