DocumentCode :
2552341
Title :
A low noise amplifier co-designed with ESD protection circuit in 65-nm CMOS
Author :
Tsai, Ming-Hsien ; Hsu, Shawn S H ; Tan, Kevin K W
Author_Institution :
Dept. of Electr. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
fYear :
2009
fDate :
7-12 June 2009
Firstpage :
573
Lastpage :
576
Abstract :
By means of co-design ESD protection circuit as the low noise amplifier (LNA) input matching network, a 5.8-GHz LNA with excellent ESD and noise performances is demonstrated by a 65-nm CMOS technology. The diode-based ESD design with a power clamp can achieve 4 kV human body model (HBM) performance while the noise figure (NF) is only 0.05 dB higher than that of the LNA without the extra ESD blocks. Under a supply voltage of 1.2 V and drain current of 7 mA, the ESD-LNA has a NF of 1.9 dB with an associated power gain of 18 dB. The input third-order intercept point (IIP3) is -11 dBm and the input and output insertion losses are below -16 dB and -20 dB, respectively.
Keywords :
CMOS integrated circuits; MMIC amplifiers; electrostatic discharge; low noise amplifiers; CMOS technology; MMIC amplifiers; current 7 mA; electrostatic discharge protection circuit; frequency 5.8 GHz; human body model; low noise amplifier; noise figure 1.9 dB; size 65 nm; voltage 1.2 V; voltage 4 kV; CMOS technology; Circuit noise; Clamps; Diodes; Electrostatic discharge; Humans; Impedance matching; Low-noise amplifiers; Noise measurement; Protection; CMOS; ESD; Low noise amplifier; power-clamp;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 2009. MTT '09. IEEE MTT-S International
Conference_Location :
Boston, MA
ISSN :
0149-645X
Print_ISBN :
978-1-4244-2803-8
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2009.5165761
Filename :
5165761
Link To Document :
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