DocumentCode :
2552566
Title :
An Ultrasonic Detecting Method Testing for Defects in Profiled Component
Author :
Yang, Lu ; Zhang, Yanhua ; Cao, Haijun
Author_Institution :
Nat. Key Lab. for Electron. Meas. Technol., North Univ. of China, Taiyuan, China
fYear :
2010
fDate :
23-25 Sept. 2010
Firstpage :
1
Lastpage :
4
Abstract :
Profiled component has some structural features, such as thin wall, small diameter and corner angle on inner wall. These features make it very difficult to detect the profiled component with ultrasound method, and the waves reflected from the inside arris have badly interfered the identification of echo signal. The ultrasonic creeping wave is used to detect the profiled component. In order to eliminate impact of inner edge wave, echo signals are divided into two parts to assure the fatal defect in the top of inner arc is not undetected. Time and amplitude characteristic value of flaw signals are extracted to distinguish between flaw signal and inner edge wave effectively. The testing results indicate that the detection with above feature extraction method can meet the application requirements of real-time, accuracy and reliability, and it would have good application foreground for on-line detection.
Keywords :
echo; feature extraction; reliability; testing; ultrasonic applications; ultrasonic waves; amplitude characteristic value; echo signal; feature extraction; flaw signals; inner edge wave; profiled component defect testing; time characteristic value; ultrasonic creeping wave; ultrasonic detecting method; Acoustics; Electron tubes; Image edge detection; Logic gates; Nondestructive testing; Surface waves;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Wireless Communications Networking and Mobile Computing (WiCOM), 2010 6th International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-3708-5
Electronic_ISBN :
978-1-4244-3709-2
Type :
conf
DOI :
10.1109/WICOM.2010.5600589
Filename :
5600589
Link To Document :
بازگشت