Abstract :
The following topics are dealt with: quantum nanoelectronics; low noise avalanche photodiode; electronic memory application; HV-LDMOS device design; highly stable delta-sigma modulator; presilicon MOSFET mismatch modeling; MEMS technology; photonics sensor technology; packaging technology and manufacturing; device failure analysis; semiconductor device fabrication; circuit device modeling; and circuit device simulation.
Keywords :
MOSFET; avalanche photodiodes; delta-sigma modulation; failure analysis; integrated circuit design; integrated circuit modelling; integrated circuit packaging; integrated circuit reliability; integrated memory circuits; microfabrication; nanoelectronics; nanofabrication; semiconductor device manufacture; semiconductor device models; semiconductor device packaging; semiconductor device reliability; semiconductor device testing; silicon; HV-LDMOS device design; MEMS technology; circuit device modeling; circuit device simulation; electronic memory application; failure analysis; highly stable delta-sigma modulator; low noise avalanche photodiode; packaging technology; photonics sensor technology; presilicon MOSFET mismatch modeling; quantum nanoelectronics; semiconductor device fabrication;
Conference_Titel :
Semiconductor Electronics, 2008. ICSE 2008. IEEE International Conference on
Conference_Location :
Johor Bahru
Print_ISBN :
978-1-4244-3873-0
DOI :
10.1109/SMELEC.2008.4770250
