Title :
Noise analysis for electronic circuit using Multisim
Author :
Wang, Xiu-Ling ; Zhang, Jia-Ying ; Wang, Wen-Lan ; Zhang, Xiao-Dong
Author_Institution :
Coll. of Electr. Power, Inner Mongolia Univ. of Technol., Inner Mongolia, China
Abstract :
Noise is electrical or electromagnetic energy that reduces the quality of a signal. Noise affects digital, analog and all communications systems. This paper introduced a noise analysis method based on Multisim. Multisim creates a noise model of the circuit, using noise models of each resistor and semiconductor device, instead of AC models, and then performs analysis. It calculates the noise contribution of each resistor and the other semiconductor device at the specified output node.
Keywords :
circuit noise; flicker noise; shot noise; thermal noise; electronic circuit; multisim; noise analysis; noise contribution; noise models; resistor; semiconductor device; 1f noise; Circuit analysis; Circuit noise; Electronic circuits; Noise figure; Noise generators; Performance analysis; Resistors; Semiconductor device noise; Semiconductor devices; Multisim; model; noise analysis; noise figure; setting parameters;
Conference_Titel :
Information Management and Engineering (ICIME), 2010 The 2nd IEEE International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-5263-7
Electronic_ISBN :
978-1-4244-5265-1
DOI :
10.1109/ICIME.2010.5478022
