Title :
Parallel algorithms for grounding grids corrosion diagnosis to improve computation speed
Author :
Jian, Liu ; Yuan, Fang
Author_Institution :
Sch. of Commun. & Inf. Eng., Xi´´an Univ. of Sci. & Technol., Xi´´an, China
Abstract :
The existing grounding grid corrosion diagnosis algorithms have large amount of calculation, they take up lots of time and are inconvenient in the practical application. In this paper, a parallel algorithm based on Local Area Network (LAN) is put forward to solve above problems. The master sub-process sends the samples needed to be calculated to the slave sub-processes on the computers of the LAN. The slave sub-processes calculate the samples at the same time and send the results back to the master sub-process. The final result will be figured out by the master sub-process after all the results being gathered. The parallel algorithms of grounding grids testability evaluation, uncertain branches estimation and monitoring pole allocation optimization are discussed, respectively. An experimental grounding grid with sixty branches is used as an example to validate the proposed parallel algorithms. The test is based on a LAN with five computers. The results show that the proposed methods are feasible and the calculation time can be shortened remarkably.
Keywords :
corrosion testing; local area networks; optimisation; parallel algorithms; power aware computing; power grids; LAN; computation speed; grounding grid corrosion diagnosis; grounding grids testability evaluation; local area network; master sub-process; parallel algorithms; pole allocation optimization monitoring; slave sub-processes; uncertain branches estimation; Application software; Computerized monitoring; Concurrent computing; Corrosion; Grid computing; Grounding; Local area networks; Master-slave; Parallel algorithms; Testing; Grounding grids; algorithm; corrosion diagnosis; genetic algorithm; parallel algorithms; testability evaluation; uncertain branches;
Conference_Titel :
Information Management and Engineering (ICIME), 2010 The 2nd IEEE International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-5263-7
Electronic_ISBN :
978-1-4244-5265-1
DOI :
10.1109/ICIME.2010.5478034