Title :
Secondary element patterns of array-fed imaging reflectors and their use for optimization of scanned pencil beams
Author_Institution :
GE Electron. Lab., Syracuse, NY, USA
fDate :
June 28 1993-July 2 1993
Abstract :
Techniques are described which provide a major improvement in the tractability of truly optimizing the complete vector pattern of array-fed Gregorian reflector systems for low sidelobe scanned beams, compared to previous scalar or ray analysis techniques. The goal was to calculate the potential for improved performance in both gain and sidelobe control, by correct choice of array excitation function in both amplitude and phase. To do this, the author sought to compute the complex secondary element patterns of each of the array elements. This makes it possible to manipulate the elemental contributions rapidly in the far field and compute the total pattern by superposition, with all amplitude and phase distortions included. For an offset geometry having a magnification of four, the secondary element patterns were evaluated for an array of 97 elements in the conjugate plane.<>
Keywords :
antenna radiation patterns; directive antennas; offset reflector antennas; optimisation; reflector antenna feeds; Gregorian reflector systems; array excitation function; array-fed imaging reflectors; complex secondary element patterns; conjugate plane; far field; gain control; offset geometry; optimization; scanned pencil beams; sidelobe control; superposition; tractability; Current density; Feeds; Near-field radiation pattern; Optical arrays; Optical distortion; Optical imaging; Phase distortion; Phased arrays; Quantum computing; Vectors;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1993. AP-S. Digest
Conference_Location :
Ann Arbor, MI, USA
Print_ISBN :
0-7803-1246-5
DOI :
10.1109/APS.1993.385517
