DocumentCode :
2553192
Title :
The retiming of single-phase clocked circuits containing level-sensitive latches
Author :
Saxena, Prashant ; Pan, Peichen ; Liu, C.L.
Author_Institution :
Strategic CAD Labs., Intel Corp., Hillsboro, OR, USA
fYear :
1999
fDate :
7-10 Jan 1999
Firstpage :
402
Lastpage :
407
Abstract :
Previous approaches to the retiming of latch-based circuits have used the different phases of the clock to prevent race conditions. However, such an approach is not applicable to single-phase clocked circuits. Consequently there is no practical formulation that retimes single-phase clocked circuits containing latches optimally. We present a novel ILP formulation for the retiming of such circuits, along with efficient algorithms to generate its constraint set. This formulation can be used to optimize any criterion whose quality depends on the latch positions and that can be expressed as a linear objective function. As examples, we discuss the optimization of the clock period and the latch count. For the latter we describe a graph transformation to linearize the max-based objective function. Our experiments demonstrate that our formulation is efficient and generates ILPs that are easy to solve
Keywords :
clocks; flip-flops; hazards and race conditions; integer programming; linear programming; logic CAD; timing; ILP formulation; clock period; constraint set; graph transformation; latch count; latch positions; latch-based circuits; level-sensitive latches; linear objective function; max-based objective function; race conditions; retiming; single-phase clocked circuits; Circuit testing; Clocks; Computer science; Ear; Flip-flops; Latches; Mesons; Minimization; Pulse circuits; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, 1999. Proceedings. Twelfth International Conference On
Conference_Location :
Goa
ISSN :
1063-9667
Print_ISBN :
0-7695-0013-7
Type :
conf
DOI :
10.1109/ICVD.1999.745189
Filename :
745189
Link To Document :
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