• DocumentCode
    2553283
  • Title

    A non-uniform sampling approach for the reduction of capacitance spread in SC circuits

  • Author

    Ausin, J.L. ; Domínguez, M.A. ; Duque-Carillo, J.F. ; Torelli, G.

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Extremadura Univ., Badajoz
  • fYear
    2006
  • fDate
    21-24 May 2006
  • Abstract
    In this paper, an effective approach to the design of large time constants implemented with switched-capacitor (SC) techniques for use in low-frequency signal processing applications, is presented. The proposed method utilizes a non-uniform sampling scheme, which adds one degree of freedom in obtaining the time constant of SC integrators. As a result, capacitor spread and total capacitor area are reduced and, hence, silicon area can be minimized. To prove the feasibility of the presented approach, the design and the implementation of a second-order lowpass notch SC filter are discussed. Experimental results from a 0.35-mum CMOS test-chip that operates at 2 kHz sampling frequency are presented
  • Keywords
    CMOS integrated circuits; low-pass filters; notch filters; switched capacitor filters; 0.35 micron; 2 kHz; CMOS test chip; SC circuits; capacitance spread reduction; lowpass notch SC filter; nonuniform sampling approach; silicon area; time constants; Capacitance; Capacitors; Circuits; Filters; Sampling methods; Signal design; Signal processing; Signal sampling; Silicon; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2006. ISCAS 2006. Proceedings. 2006 IEEE International Symposium on
  • Conference_Location
    Island of Kos
  • Print_ISBN
    0-7803-9389-9
  • Type

    conf

  • DOI
    10.1109/ISCAS.2006.1693726
  • Filename
    1693726