DocumentCode :
2553283
Title :
A non-uniform sampling approach for the reduction of capacitance spread in SC circuits
Author :
Ausin, J.L. ; Domínguez, M.A. ; Duque-Carillo, J.F. ; Torelli, G.
Author_Institution :
Dept. of Electron. & Electr. Eng., Extremadura Univ., Badajoz
fYear :
2006
fDate :
21-24 May 2006
Abstract :
In this paper, an effective approach to the design of large time constants implemented with switched-capacitor (SC) techniques for use in low-frequency signal processing applications, is presented. The proposed method utilizes a non-uniform sampling scheme, which adds one degree of freedom in obtaining the time constant of SC integrators. As a result, capacitor spread and total capacitor area are reduced and, hence, silicon area can be minimized. To prove the feasibility of the presented approach, the design and the implementation of a second-order lowpass notch SC filter are discussed. Experimental results from a 0.35-mum CMOS test-chip that operates at 2 kHz sampling frequency are presented
Keywords :
CMOS integrated circuits; low-pass filters; notch filters; switched capacitor filters; 0.35 micron; 2 kHz; CMOS test chip; SC circuits; capacitance spread reduction; lowpass notch SC filter; nonuniform sampling approach; silicon area; time constants; Capacitance; Capacitors; Circuits; Filters; Sampling methods; Signal design; Signal processing; Signal sampling; Silicon; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2006. ISCAS 2006. Proceedings. 2006 IEEE International Symposium on
Conference_Location :
Island of Kos
Print_ISBN :
0-7803-9389-9
Type :
conf
DOI :
10.1109/ISCAS.2006.1693726
Filename :
1693726
Link To Document :
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