Title :
A power-scalable linearized model for RF power amplifiers starting from S-parameter measurements
Author :
Vandermot, Koen ; Rolain, Yves ; Vandersteen, Gerd ; Pintelon, Rik ; Ferranti, Francesco ; Dhaene, Tom
Author_Institution :
Dep. ELEC, Vrije Univ. Brussel, Brussels, Belgium
Abstract :
A method is proposed to estimate the dasiabest linear approximationpsila of RF power amplifiers excited by spectrally rich signals under variable input power levels. Since the input-output behavior of these amplifiers is not only a function of the frequency, but also of the input power, a 2-dimensional model that linearizes the behavior will be needed. The proposed method estimates a 2D rational model in the frequency variable jomega and the input power P. The proposed approach is suitable for the experimental characterization of existing RF power amplifiers.
Keywords :
S-parameters; maximum likelihood estimation; power amplifiers; radiofrequency amplifiers; radiofrequency measurement; 2D rational model; RF measurement; RF power amplifiers; S-parameter measurements; best linear approximation; maximum likelihood estimation; power-scalable linearized model; Frequency estimation; Least squares approximation; Linear approximation; Power amplifiers; Power measurement; Power system modeling; RF signals; Radio frequency; Radiofrequency amplifiers; Scattering parameters; Best Linear Approximation; Maximum Likelihood Estimation; Nonlinear; RF amplifiers; RF measurements; black-box;
Conference_Titel :
Microwave Symposium Digest, 2009. MTT '09. IEEE MTT-S International
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-2803-8
Electronic_ISBN :
0149-645X
DOI :
10.1109/MWSYM.2009.5165804
