Title :
An extended UTD analysis for RCS computations involving higher order curved surfaces
Author :
Constantinides, E.D. ; Marhefka, R.J.
Author_Institution :
Dept. of Electr. Eng., Ohio State Univ., Columbus, OH, USA
fDate :
June 28 1993-July 2 1993
Abstract :
The extended UTD (uniform geometrical theory of diffraction) analysis involves the use of spatial domain radiation integrals for the scattered fields. The relevant scattering mechanisms are then identified through uniform asymptotic evaluation procedures complemented with some rather heuristic modifications based on physical arguments. The typical scattering mechanisms involved are described by a new set of uniform reflection, first-order edge and zero-curvature diffraction coefficients that remain valid inside the transition regions and also reduce to the classic ray optical expressions in the exterior. In order to illustrate the accuracy of the extended UTD solution, numerical results are presented for a cubic polynomial strip and a superquadric cylinder. In both cases, the extended UTD result compares very well with the method of moments when the higher order mechanisms are not significant. The classic ray optical results, however, exhibit caustic singularities and discontinuities.<>
Keywords :
electromagnetic wave scattering; geometrical theory of diffraction; method of moments; radar cross-sections; ray tracing; RCS computations; accuracy; caustic singularities; cubic polynomial strip; diffraction coefficients; discontinuities; extended UTD analysis; heuristic modifications; higher order curved surfaces; method of moments; ray optical expressions; scattering mechanisms; spatial domain radiation integrals; superquadric cylinder; transition regions; uniform asymptotic evaluation procedures; uniform geometrical theory of diffraction; Geometrical optics; Moment methods; Optical diffraction; Optical reflection; Optical scattering; Optical surface waves; Physical optics; Polynomials; Strips; Surface waves;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1993. AP-S. Digest
Conference_Location :
Ann Arbor, MI, USA
Print_ISBN :
0-7803-1246-5
DOI :
10.1109/APS.1993.385531