Title :
A diagnostic fault simulator for fast diagnosis of bridge faults
Author :
Wu, Jue ; Rudnick, Elizabeth M.
Author_Institution :
Sun Microsyst., Menlo Park, CA, USA
Abstract :
A new diagnostic fault simulator is described that diagnoses both feedback and non-feedback bridge faults while using information from fault simulation of single stuck-at faults. A realistic fault model is used which considers the existence of the Byzantine Generals Problem. The approach has been demonstrated for two-line bridge faults on several large combinational benchmark circuits and has achieved over 98% accuracy for non-feedback bridge faults and over 80% accuracy for feedback bridge faults with good diagnostic resolution
Keywords :
VLSI; circuit analysis computing; combinational circuits; digital integrated circuits; failure analysis; fault simulation; integrated circuit testing; integrated logic circuits; logic simulation; logic testing; Byzantine Generals Problem; bridge faults diagnosis; diagnostic fault simulator; fast diagnosis; feedback bridge faults; large combinational benchmark circuits; nonfeedback bridge faults; realistic fault model; single stuck-at faults; two-line bridge faults; Bridge circuits; Circuit faults; Circuit simulation; Computational modeling; Dictionaries; Failure analysis; Fault diagnosis; Feedback circuits; Logic testing; Process design;
Conference_Titel :
VLSI Design, 1999. Proceedings. Twelfth International Conference On
Conference_Location :
Goa
Print_ISBN :
0-7695-0013-7
DOI :
10.1109/ICVD.1999.745204
