DocumentCode :
255362
Title :
Automated fault diagnosis in Multiple Inductive Loop Detectors
Author :
Kurian, N.A. ; Thomas, A. ; George, B.
Author_Institution :
Dept. of Electron. & Commun. Eng., Rajagiri Sch. of Eng. & Technol., Kochi, India
fYear :
2014
fDate :
11-13 Dec. 2014
Firstpage :
1
Lastpage :
5
Abstract :
Multiple Inductive Loop Detectors are advanced Inductive Loop Sensors that can measure traffic flow parameters in even conditions where the traffic is heterogeneous and does not conform to lanes. This sensor consists of many inductive loops in series, with each loop having a parallel capacitor across it. These inductive and capacitive elements of the sensor may undergo open or short circuit faults during operation. Such faults lead to erroneous interpretation of data acquired from the loops. Conventional methods used for fault diagnosis in inductive loop detectors consume time and effort as they require experienced technicians and involve extraction of loops from the saw-cut slots on the road. This also means that the traffic flow parameters cannot be measured until the sensor system becomes functional again. The repair activities would also disturb traffic flow. This paper presents a method for automating fault diagnosis for series-connected Multiple Inductive Loop Detectors, based on an impulse test. The system helps in the diagnosis of open/short faults associated with the inductive and capacitive elements of the sensor structure by displaying the fault status conveniently. Since the fault location as well as the fault type can be precisely identified using this method, the repair actions are also localised. The proposed system thereby results in significant savings in both repair time and repair costs. An embedded system was developed to realize this scheme and the same was tested on a loop prototype.
Keywords :
embedded systems; fault location; inductive sensors; automated fault diagnosis; embedded system; fault location; series-connected multiple inductive loop detectors; traffic flow detectors; Circuit faults; Detectors; Fault diagnosis; Frequency response; Resonant frequency; Vehicles; Embedded System; Fault Diagnosis; Multiple Inductive Loop Detectors; Transfer Function;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
India Conference (INDICON), 2014 Annual IEEE
Conference_Location :
Pune
Print_ISBN :
978-1-4799-5362-2
Type :
conf
DOI :
10.1109/INDICON.2014.7030431
Filename :
7030431
Link To Document :
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