Title :
Fault diagnosis of PTA oxidation process based on decision tree and ant colony optimization
Author :
Zheng, Xiaoxea ; Qian, Feng
Author_Institution :
Sch. of Electr. Power & Autom. Eng., Shanghai Univ. of Electr. Power, Shanghai
Abstract :
Data mining technique can extract desired knowledge from existing databases and ease knowledge acquisition bottleneck of fault diagnosis. A new knowledge acquisition method combined of decision tree and rough set theory is thus proposed for fault diagnosis in this paper. Based on the reduction by rough set theory, decision tree extract diagnostic knowledge from the reduced decision tables in the form of symbolic trees. Trend correlation degree, as the heuristic knowledge, is proposed to evaluate the significance of condition attributes for the construction of decision tree model. Also a modified ant colony algorithm is introduced to determine the optimal fault test sequence of the decision tree model. The proposed method is applied to the fault diagnosis of purified terephthalic acid (PTA) oxidation reactor, which is the key unit in AMOCO PTA production technique. The results show the method is satisfactory and suitable for industrial application.
Keywords :
chemical industry; chemical reactors; data mining; data reduction; decision trees; fault diagnosis; optimisation; oxidation; rough set theory; AMOCO PTA production; PTA oxidation process; ant colony optimization; data mining; data reduction; database knowledge extraction; decision tree model; fault diagnosis; industrial application; knowledge acquisition; optimal fault test sequence; purified terephthalic acid oxidation reactor; rough set theory; Ant colony optimization; Data mining; Databases; Decision trees; Fault diagnosis; Inductors; Knowledge acquisition; Oxidation; Set theory; Testing; Ant colony algorithm; Decision tree; Fault diagnosis; Rough set theory; Trend correlation degree;
Conference_Titel :
Control and Decision Conference, 2008. CCDC 2008. Chinese
Conference_Location :
Yantai, Shandong
Print_ISBN :
978-1-4244-1733-9
Electronic_ISBN :
978-1-4244-1734-6
DOI :
10.1109/CCDC.2008.4597361