Title :
Study of fault diagnosis system of TCAS intelligent circuit board
Author :
Yun-lin, Luo ; Cong, Du
Author_Institution :
Aeronaut. Autom. Coll., Civil Aviation Univ. of China, Tianjin
Abstract :
Nowadays, the test equipments for TCAS (traffic-alert and collision avoidance system) can only test troubles of shooting boards, but it can not find the detailed fault components. It is difficult to test intelligent circuit board (circuit board with CPU) with fording the detailed fault components of the trouble boards. This paper introduces a new way of fault testing of circuit board with CPU and how to accomplish it.
Keywords :
collision avoidance; fault diagnosis; printed circuits; road traffic; TCAS intelligent circuit board; collision avoidance system; fault diagnosis system; traffic-alert; Automation; Circuit faults; Circuit testing; Collision avoidance; Educational institutions; Fault diagnosis; Intelligent systems; Printed circuits; Read only memory; System testing; Fault Testing; Intelligent Circuit Board; TCAS;
Conference_Titel :
Control and Decision Conference, 2008. CCDC 2008. Chinese
Conference_Location :
Yantai, Shandong
Print_ISBN :
978-1-4244-1733-9
Electronic_ISBN :
978-1-4244-1734-6
DOI :
10.1109/CCDC.2008.4597364
