Title :
Self-calibration of gain and output match in LNAs
Author :
Das, Tejasvi ; Mukund, P.R.
Author_Institution :
Rochester Inst. of Technol., NY
Abstract :
Increasing process variations and tolerance limits with successive scaling, along with rising costs per design cycle have made the fault-tolerance paradigm pertinent in RFICs. Due to the high frequencies involved, traditional fault-tolerance methods used in digital and lower frequency analog circuits cannot be applied. This paper presents a non-intrusive and robust technique of self-calibrating the gain and output match of LNAs. It involves very low overheads and does not degrade circuit performance in any measurable way, in addition to ultra-fast calibration times (lower than 50 mus). We present simulation results of the system designed in the IBM 0.25 mum process
Keywords :
amplification; automatic gain control; fault tolerance; impedance matching; low noise amplifiers; radiofrequency integrated circuits; 0.25 micron; IBM; LNA; RFIC; fault-tolerance; gain self-calibration; output match; Analog circuits; Calibration; Circuit optimization; Costs; Degradation; Fault tolerance; Frequency; Impedance matching; Radiofrequency integrated circuits; Robustness;
Conference_Titel :
Circuits and Systems, 2006. ISCAS 2006. Proceedings. 2006 IEEE International Symposium on
Conference_Location :
Island of Kos
Print_ISBN :
0-7803-9389-9
DOI :
10.1109/ISCAS.2006.1693750