Title :
Seventh International Workshop on Microprocessor Test and Verification-Title
Abstract :
The following topics are discussed: microprocessor test and verification; test generation; architectural and design issues; and design error debugging and diagnosis.
Keywords :
computer architecture; fault diagnosis; integrated circuit design; integrated circuit testing; microprocessor chips; design error debugging; design error diagnosis; microprocessor architecture; microprocessor design; microprocessor test; microprocessor verification; test generation;
Conference_Titel :
Microprocessor Test and Verification, 2006. MTV '06. Seventh International Workshop on
Conference_Location :
Austin, TX
Print_ISBN :
0-7695-2839-2
DOI :
10.1109/MTV.2006.17
