DocumentCode :
2554093
Title :
Circuit Profiling Mechanisms for High-Level ATPG
Author :
Campos, Jorge ; Al-Asaad, Hussain
Author_Institution :
Univ. of California, Davis
fYear :
2006
fDate :
4-5 Dec. 2006
Firstpage :
9
Lastpage :
14
Abstract :
Our Mutation-based Validation Paradigm (MVP) is a validation environment for high-level microprocessor implementations. To be able to efficiently generate test sequences, we need to enable MVP´s ATPG to learn important details of the circuit under validation as a means to explore critical new circuit scenarios. In this paper, we present new profiling mechanisms that can exist either as a pre-processor that gathers circuit information prior to the circuit validation process, or as run-time entities that allow MVP to learn from its progressive experience.
Keywords :
automatic test pattern generation; circuit testing; high level synthesis; logic testing; microprocessor chips; ATPG; circuit profiling mechanism; high-level microprocessor; mutation-based validation paradigm; Analytical models; Automatic test pattern generation; Circuit analysis; Circuit simulation; Circuit testing; Design engineering; Hardware design languages; Microprocessors; Observability; Runtime;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microprocessor Test and Verification, 2006. MTV '06. Seventh International Workshop on
Conference_Location :
Austin, TX
ISSN :
1550-4093
Print_ISBN :
0-7695-2839-2
Type :
conf
DOI :
10.1109/MTV.2006.6
Filename :
4197216
Link To Document :
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