Title :
Statistical Static Timing Analysis Considering the Impact of Power Supply Noise in VLSI Circuits
Author :
Kim, Hyun Sung ; Walker, D.M.H.
Author_Institution :
Texas A&M Univ., College Station
Abstract :
As semiconductor technology is scaled and voltage level is reduced, the impact of power supply variation has become very significant in predicting the realistic worst-case delays in integrated circuits. The analysis of power supply noise is inevitable since there is a high correlation between delay and supply voltage. Supply noise analysis has often used a vector-based STA approach. However, vector-based approaches are very expensive, particularly during the design phase. In this work, two novel vectorless approaches are described such that circuit delay increases due to power supply noise can be efficiently estimated. Experimental results on ISCAS89 circuits show not only the accuracy of our approaches, but also the indispensability of considering care-bits, which sensitize the longest paths during the power supply noise analysis.
Keywords :
VLSI; network analysis; noise; power supply circuits; statistical analysis; timing; ISCAS89 circuits; VLSI circuits; integrated circuits; power supply noise analysis; power supply variation; semiconductor technology scaling; statistical static timing analysis; vector-based approaches; voltage level reduction; worst-case delays; Circuit analysis; Circuit noise; Delay estimation; Integrated circuit noise; Integrated circuit technology; Power supplies; Semiconductor device noise; Timing; Very large scale integration; Voltage;
Conference_Titel :
Microprocessor Test and Verification, 2006. MTV '06. Seventh International Workshop on
Conference_Location :
Austin, TX
Print_ISBN :
0-7695-2839-2
DOI :
10.1109/MTV.2006.20